AFM

Atomic Force Micoscope is a very-high resolution type of scanning probe microscope that creates an image by tapping the sample surface with a probe. It can also measure surface roughness and mechanical properties, and allows some forms of microfabrication.

A Multimode SPM 8 equipped with a Nanoscope V control unit (Bruker AXS). The SPM is also equipped with a PicoForce Unit, a Heater Unit, and the ScanAsyst and Peak Force Tapping softwares (Bruker AXS). Furthermore, a digital oscilloscope (Tektronix TDS 2022C) and a Nikon optical microscope are coupled to the system.